Direct LiF imaging diagnostics on refractive X-ray focusing at the EuXFEL High Energy Density instrument

Makarov, S.; Makita, M.; Nakatsutsumi, M.; Pikuz, T.; Ozaki, N.; Preston, T.R.; Appel, K.; Konopkova, Z.; Cerantola, V.; Brambrink, E.; Schwinkendorf, J.-P.; Mohacsi, I.; Burian, T.; Chalupsky, J.; Hajkova, V.; Juha, L.; Vozda, V.; Nagler, B.; Zastrau, U.; Pikuz, S.

doi:10.1107/S1600577522006245

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Figure 5
Schematic drawing of intensity distribution measurements of the XFEL beam near the focus position, and sequence of PL images, obtained in one XFEL shot on the surface of the LiF detector in different planes. Lower images are intensity profiles for Z-positions of −8.8 mm, 0 mm and 7 mm.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 30| Part 1| January 2023| Pages 208-216

https://doi.org/10.1107/S1600577522006245

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