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Figure 16
Two-dimensional 4.5 mm raster scan across the surface of a 2.3 µm-thick SiC within a 362 µm-thick frame XBPM. The signal current obtained from an intensity monitoring diode placed downstream of the XBPM assembly is plotted, and the intensity scale shows the diode's signal current.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 30| Part 5| September 2023| Pages 876-884
https://doi.org/10.1107/S1600577523005623
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