|
Figure 7
Results of 1D scans of the X-ray beam moving across the face of the detectors, with varying bias voltages applied. Top: 20 µm-thick single-crystal diamond. Bottom: 2.3 µm-thick SiC within a 362 µm-thick frame. |
Open
access

|
Figure 7
Results of 1D scans of the X-ray beam moving across the face of the detectors, with varying bias voltages applied. Top: 20 µm-thick single-crystal diamond. Bottom: 2.3 µm-thick SiC within a 362 µm-thick frame. |