view article
Figure 9
Data from Fig. 8[link] focused on the low-flux data showing the total current measured on the 4H-SiC XBPM with respect to the total current measured on the sc-diamond XBPM as the flux of the incident X-ray beam was changed, with and without a 5 V external bias voltage applied to the 4H-SiC XBPM.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 30| Part 5| September 2023| Pages 876-884
https://doi.org/10.1107/S1600577523005623
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS