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Figure 1
Schematic illustration of X-ray ptychography, where a coherent beam is scanned across the sample. Pixelated detectors record the far-field diffraction pattern, with beyond-optic, high-spatial-resolution information recorded at large scattering angles. This approach benefits tremendously from the historical increase in available coherent flux, which outpaces Moore's law for integrated circuits. Taking full advantage of these sources requires the development of advanced detectors, such as reported in this issue by Takahashi et al. (2023BB3).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 30| Part 5| September 2023| Pages 859-860
https://doi.org/10.1107/S1600577523007269
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