Inversion model for extracting chemically resolved depth profiles across liquid interfaces of various configurations from XPS data: PROPHESY

Ozon, M.; Tumashevich, K.; Lin, J.J.; Prisle, N.L.

doi:10.1107/S1600577523006124

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

IUCr IT WDC

home archive editors for authors for readers submit open access

disable zoom view article reuse permissions

Figure 5
Reconstruction of concentration profile for three different simulated experimental acquisition setups: (a) and (b) five attenuation lengths over the range [1.62, 1.95] nm (N₅); (c) and (d) five attenuation lengths over the range [1.28, 5.5] nm (W₅); and (e) and (f) ten attenuation lengths over the range [1.28, 5.5] nm (W₁₀). The panels (a), (c) and (e) show the estimates and the different variability, with respect to the measurement noise in orange ( $[\Gamma_{\hat{\rho}|A^{m}\!,{\bf y}_{0}}]$ ), and with respect to the measurement model error in red ( $[\Gamma_{\hat{\rho}|A^{m}_{0}{\bf y}}]$ ). The panels (b), (d) and (f) show the conditional posterior probability $[{\cal P}(\rho|A^{m}\!,{\bf y})]$ (blue), and the marginals $[{\cal P}(\rho|A^{m}\!,{\bf y}_{0})]$ (orange) and $[{\cal P}(\rho|A^{m}_{0},{\bf y})]$ (red).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 30| Part 5| September 2023| Pages 941-961

https://doi.org/10.1107/S1600577523006124

Open

access

Follow J. Synchrotron Rad.

Search IUCr Journals		doi		Advanced search
Author		volume	page