High-resolution and high-sensitivity X-ray ptychographic coherent diffraction imaging using the CITIUS detector

Takahashi, Y.; Abe, M.; Uematsu, H.; Takazawa, S.; Sasaki, Y.; Ishiguro, N.; Ozaki, K.; Honjo, Y.; Nishino, H.; Kobayashi, K.; Hiraki, T.N.; Joti, Y.; Hatsui, T.

doi:10.1107/S1600577523004897

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Figure 2
(a) Diffraction pattern without the sample, showing overall (left) and an enlarged view (right) of the low-spatial frequency region. (b) Diffraction patterns of the 200 nm-thick test chart, showing overall (left) and an enlarged view (right) of the low-spatial frequency region. (c) One-dimensional intensity distribution of the diffraction patterns shown in (a) and (b) along the q_x direction at q_z = 0.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 30| Part 5| September 2023| Pages 989-994

https://doi.org/10.1107/S1600577523004897

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