Figure 4
(a) Reconstructed phase and magnified image of the 6 nm-thick Ta test chart. (b) Histogram of the phase distribution in (a), fit with a composite function consisting of two Gaussian functions. (c) FE-SEM image of silica particles with an approximate diameter of 30 nm. (d) Ptychographic phase and magnified images corresponding to the same field of view as in (c). (e) Cross-sectional profile of the red dotted line in (d). (f) Phase retrieval transfer function for the reconstructed images of the 6 nm-thick Ta test chart and silica particles. |