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Figure 6
(a, b) In situ PXRD patterns (the wavelength of the X-rays is 0.207286 Å) and (c, d) In K-edge XANES of PdO/rh-In2O3 material obtained during pressurizing using pure H2 up to 15 bar (a and c), followed by heating at 15 bar from rt to 450°C (b and d). The residual in the inset in (c) highlights that no significant changes in the edge position can be observed during pressurizing.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 31| Part 1| January 2024| Pages 77-84
https://doi.org/10.1107/S1600577523009591
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