X-ray optics for the cavity-based X-ray free-electron laser

Liu, P.; Pradhan, P.; Shi, X.; Shu, D.; Kauchha, K.; Qiao, Z.; Tamasaku, K.; Osaka, T.; Zhu, D.; Sato, T.; MacArthur, J.; Huang, X.; Assoufid, L.; White, M.; Kim, K.-J.; Shvyd'ko, Y.

doi:10.1107/S1600577524003977

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Figure 8
Schematics and X-ray characterization results of silicon channel-cut crystals. (a) Showing 3D models of four-bounce Si(660) and Si(620) channel-cut Si crystals. (b) Schematic of the X-ray testing setup. (c)–(d) X-ray Bragg reflection maps of selected 4 × Si(660) and 4 × Si(620) crystals, respectively. (e)–(f) Measured Bragg reflection curves (in black) of a 4 × Si(660) and 4 × Si(620) crystal, respectively, compared with theoretical curves (in red). See text for more details.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 31| Part 4| July 2024| Pages 751-762

https://doi.org/10.1107/S1600577524003977

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