issue contents
July 2024 issue

Cover illustration: Reconstructed 3D magnetic structure of a 5 µm-diameter pillar from a Nd2Fe14B single crystal using dichroic scanning hard X-ray nanotomography at the NanoMAX beamline at the MAX IV synchrotron radiation source (see Banerjee, Gürsoy, Deng, Kahnt, Kramer, Lynn, Haskel and Strempfer, pages 877–887).
facility information
editorial

feature articles

PhotonMEADOW2023 workshop


The beam shaping optics of synchrotrons and X-ray free-electron lasers are routinely measured using deflectometric profilometers, which use autocollimators to evaluate the surface slope from the displacement of a reticle image on a detector. Here, novel strategies to reduce systematic measurement errors by using a set of overlapping images of the reticle obtained at different positions on the detector, which can reduce the systematic errors by up to a factor of four to five without recourse to external measurements, are discussed.






x-ray spectroscopy for functional materials


research papers



















short communications

beamlines


computer programs

teaching and education

notes and news
