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July 2024 issue

Cover illustration: Reconstructed 3D magnetic structure of a 5 µm-diameter pillar from a Nd2Fe14B single crystal using dichroic scanning hard X-ray nanotomography at the NanoMAX beamline at the MAX IV synchrotron radiation source (see Banerjee, Gürsoy, Deng, Kahnt, Kramer, Lynn, Haskel and Strempfer, pages 877–887).
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accessPhotonMEADOW2023 workshop
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accessThe beam shaping optics of synchrotrons and X-ray free-electron lasers are routinely measured using deflectometric profilometers, which use autocollimators to evaluate the surface slope from the displacement of a reticle image on a detector. Here, novel strategies to reduce systematic measurement errors by using a set of overlapping images of the reticle obtained at different positions on the detector, which can reduce the systematic errors by up to a factor of four to five without recourse to external measurements, are discussed.
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accessx-ray spectroscopy for functional materials
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