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Figure 7
Movement of the specular reflected X-ray beam while scanning along the surface deflection induced by the laser beam profile for mercury, water and 0.5 M NaI solution with different laser properties. The measurements were taken at the qz position 0.3 Å−1. Data are shown as symbols and lines indicate best fits of the sample surface profile (Table 1[link]). The dashed line indicates the position for the X-ray specular peak on the detector without laser irradiation. The individual curves are offset with respect to each other for clarity.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 31| Part 4| July 2024|
https://doi.org/10.1107/S1600577524003400
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