High-throughput and high-resolution powder X-ray diffractometer consisting of six sets of 2D CdTe detectors with variable sample-to-detector distance and innovative automation system

Kawaguchi, S.; Kobayashi, S.; Yamada, H.; Ashitani, H.; Takemoto, M.; Imai, Y.; Hatsui, T.; Sugimoto, K.; Sakata, O.

doi:10.1107/S1600577524003539

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Figure 7
(a) The powder diffraction pattern of LaB₆ at room temperature (RT) using an X-ray energy of 60 keV. The inset shows the diffraction patterns of the LaB₆ and Pt powder samples in the high-Q region collected at room temperature and 100 K. (b) The Rietveld fitting result for the Ni powder sample. The inset shows the PDF fitting result obtained using PDFgui. The dotted plot shows the measured data and the line shows the calculated data.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 31| Part 4| July 2024| Pages 955-967

https://doi.org/10.1107/S1600577524003539

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