High-throughput and high-resolution powder X-ray diffractometer consisting of six sets of 2D CdTe detectors with variable sample-to-detector distance and innovative automation system

Kawaguchi, S.; Kobayashi, S.; Yamada, H.; Ashitani, H.; Takemoto, M.; Imai, Y.; Hatsui, T.; Sugimoto, K.; Sakata, O.

doi:10.1107/S1600577524003539

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Figure 9
(a) A time-resolved powder diffraction intensity map of the CPL-1 sample at 100 K obtained in the gas-shot mode using an X-ray energy of 22 keV. (b) The time dependence of the Ar gas pressure. (c) The 1D powder diffraction patterns 120, 420, 450, 480, 540 and 1200 ms after the measurement started.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 31| Part 4| July 2024| Pages 955-967

https://doi.org/10.1107/S1600577524003539

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