Figure 6
Hard X-ray core-level photoelectron diffraction patterns measured at beamline P22 of PETRA III. The top row shows silicon 1s, 2s and 2p patterns and the bottom row shows germanium 2p and 3p patterns, recorded at (a), (c), (e), (f) hν = 6 keV, (b) 3.266 keV and (g) 3.28 keV. (d, h) Corresponding ToF spectra with corresponding energies Ekin. |