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Figure 3
SAM measurements of an Si mirror for 1D-IBF correction, demonstrating the improvement in r.m.s. height error using the SAM instrument.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 31| Part 4| July 2024| Pages 706-715
https://doi.org/10.1107/S1600577524004594
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