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Figure 5
(a) Fully assembled MM in the reflectometer. In the beam direction, the pores of the MM can be seen as well as the goniometer head for alignment on the left and the semiconductor photodiodes for the reflectance measurements in the back. (b) From a top view, the coating stripes on the top surface and the SDD for the XRF detection are visible.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 31| Part 4| July 2024| Pages 716-722
https://doi.org/10.1107/S1600577524004090
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