Diffractometer for element-specific analysis on local structures using a combination of X-ray fluorescence holography and anomalous X-ray scattering

Tajiri, H.; Kohara, S.; Kimura, K.; Halubai, S.; Morimoto, H.; Happo, N.; Stellhorn, J.R.; Onodera, Y.; Qiao, X.; Urushihara, D.; Hu, P.; Wakihara, T.; Kinoshita, T.; Hayashi, K.

doi:10.1107/S1600577524011366

Journal of Synchrotron Radiation Journal of
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Figure 1
Photograph of the diffractometer for XFH and AXS on the BL47XU beamline at SPring-8. The dimensions of the instrument are 1.8 m (length) × 1.6 m (width) × 2.2 m (maximum height), with a weight of 2.5 t.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 32| Part 1| January 2025| Pages 125-132

https://doi.org/10.1107/S1600577524011366

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