issue contents

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775

January 2025 issue

Early view articles

Journal cover

facility information


perspectives


J. Synchrotron Rad. (2025). 32
https://doi.org/10.1107/S1600577524010798
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An insight is given into the motivation as well as the journey of establishing this important journal for the IUCr and the synchrotron radiation community.

research papers


J. Synchrotron Rad. (2025). 32
https://doi.org/10.1107/S1600577524009664
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Through numerical optimization of cooling lengths and cooling groove positions for the first reflection mirror of a free-electron laser, the root mean square of the height error of the mirror's thermal deformation was minimized. The optimized mirror design effectively mitigated stray light and enhanced the peak intensity of the focus spot at the sample, thereby enhancing the optical performance of the high-heat-load mirror under high repetition rates at beamline FEL-II of the SHINE facility.

J. Synchrotron Rad. (2025). 32
https://doi.org/10.1107/S160057752400986X
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The development of instrumentation as well as applications for megahertz X-ray phase contrast imaging at the Single Particles, Clusters, and Biomolecules and Serial Femtosecond Crystallography instrument of the European XFEL are introduced.

J. Synchrotron Rad. (2025). 32
https://doi.org/10.1107/S1600577524009755
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The major principles and requirements of asymmetric and inclined double-crystal monochromators are re-examined and presented to guide their design and development for significantly reducing heat load density and gradient on the monochromators of fourth-generation synchrotron light sources and X-ray free-electron lasers.

beamlines


J. Synchrotron Rad. (2025). 32
https://doi.org/10.1107/S1600577524009779
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A hard X-ray single-shot spectrometer comprising thin, bent Si crystals has been developed for the Pohang Accelerator Laboratory X-ray Free-Electron Laser (XFEL), for detailed analysis of ultrafast 4.5–17 keV XFEL pulses with a high spectral resolution. This instrument facilitates shot-to-shot spectral structure monitoring and optimization of the operating conditions of the XFEL owing to its ability to provide comprehensive data on the spectral properties and fluctuations of self-amplified spontaneous emission, monochromatic and seeded XFEL modes.
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