view article
Figure 3
(a) Hologram pattern of XFH from a Ge single crystal under 14.5 keV incident X-rays, with intensity variation in the range of ±0.3%. Clear emission lines by a standing wave can be observed. (b) Reconstructed Ge atomic image from the hologram. The open circles denote the expected positions of Ge atoms.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 32| Part 1| January 2025|
https://doi.org/10.1107/S1600577524011366
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS