Diffractometer for element-specific analysis on local structures using a combination of X-ray fluorescence holography and anomalous X-ray scattering

Tajiri, H.; Kohara, S.; Kimura, K.; Halubai, S.; Morimoto, H.; Happo, N.; Stellhorn, J.R.; Onodera, Y.; Qiao, X.; Urushihara, D.; Hu, P.; Wakihara, T.; Kinoshita, T.; Hayashi, K.

doi:10.1107/S1600577524011366

Journal of Synchrotron Radiation Journal of
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Figure 4
(a) Hologram pattern of XFH from a scolecite single crystal, with extremely blurred emission lines. (b) RC of the 001 Bragg reflection from the scolecite. The inset shows χ scan results for the angle refinement.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 32| Part 1| January 2025| Pages 125-132

https://doi.org/10.1107/S1600577524011366

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