Diffractometer for element-specific analysis on local structures using a combination of X-ray fluorescence holography and anomalous X-ray scattering

Tajiri, H.; Kohara, S.; Kimura, K.; Halubai, S.; Morimoto, H.; Happo, N.; Stellhorn, J.R.; Onodera, Y.; Qiao, X.; Urushihara, D.; Hu, P.; Wakihara, T.; Kinoshita, T.; Hayashi, K.

doi:10.1107/S1600577524011366

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Figure 6
(a) RC of the 002 reflection from an LiF analyser crystal with 20 keV X-rays, of which the angular width corresponds to the energy resolution (ΔE) of approximately 13 eV. (b) Energy spectrum using the LiF analyser in a coarse resolution mode with different scattering angles (40°–70°). Spectra for higher angles are displayed upward for clarity. Elastic and Compton components are distinctly resolved in addition to resonant Raman scattering.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 32| Part 1| January 2025| Pages 125-132

https://doi.org/10.1107/S1600577524011366

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