Diffractometer for element-specific analysis on local structures using a combination of X-ray fluorescence holography and anomalous X-ray scattering

Tajiri, H.; Kohara, S.; Kimura, K.; Halubai, S.; Morimoto, H.; Happo, N.; Stellhorn, J.R.; Onodera, Y.; Qiao, X.; Urushihara, D.; Hu, P.; Wakihara, T.; Kinoshita, T.; Hayashi, K.

doi:10.1107/S1600577524011366

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Figure 7
(a) XTS of silica glass using the three-detector array system with 20 keV X-rays in 1 h (accumulation time of 20 s in each point). Instrument backgrounds (BGs) are plotted together. (b) Total structure factor, S(Q), of silica glass derived from the data in (a). For comparison, HEXTS data are displayed upward by 1 for clarity.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 32| Part 1| January 2025|

https://doi.org/10.1107/S1600577524011366

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