Diffractometer for element-specific analysis on local structures using a combination of X-ray fluorescence holography and anomalous X-ray scattering

Tajiri, H.; Kohara, S.; Kimura, K.; Halubai, S.; Morimoto, H.; Happo, N.; Stellhorn, J.R.; Onodera, Y.; Qiao, X.; Urushihara, D.; Hu, P.; Wakihara, T.; Kinoshita, T.; Hayashi, K.

doi:10.1107/S1600577524011366

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Figure 8
(a) Total structure factor, S(Q), and differential structure factor, ΔS(Q), obtained from XTS and AXS, respectively, of the 15Ag₂O–15ZnO–70B₂O₃ glass. (b) Total g(r) and Δg(r) derived from the data in (a). The total g(r) shows peaks corresponding to B—O, Zn—O, Ag—O, and cation—cation correlations, whereas Δg(r) highly enhanced the Ag—O bond length, depicting element-specific features. Dashed lines are provided as guides.

JOURNAL OF
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ISSN: 1600-5775

Volume 32| Part 1| January 2025|

https://doi.org/10.1107/S1600577524011366

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