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Figure 1
Schematic of 5D XAFS data (3D space + energy + time) obtained through the use of analytical methods in spectromicroscopy, such as XAFS-CT or TXM.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 32| Part 1| January 2025| Pages 162-170
https://doi.org/10.1107/S1600577524011226
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