Development and testing of a dual-frequency real-time hardware feedback system for the hard X-ray nanoprobe beamline of the SSRF

Jiang, Z.; Jiang, H.; He, Y.; He, Y.; Liang, D.; Yu, H.; Li, A.; Signorato, R.

doi:10.1107/S1600577524010208

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Figure 6
Measured vibration data sampled at 1 kHz over 10 s in the horizontal direction. (a) Comparison of raw data using different cut-off frequencies, and (b) comparison of RMS vibration levels associated with the same cut-off frequencies.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 32| Part 1| January 2025| Pages 100-108

https://doi.org/10.1107/S1600577524010208

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