Development and testing of a dual-frequency real-time hardware feedback system for the hard X-ray nanoprobe beamline of the SSRF

Jiang, Z.; Jiang, H.; He, Y.; He, Y.; Liang, D.; Yu, H.; Li, A.; Signorato, R.

doi:10.1107/S1600577524010208

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

IUCr IT WDC

home archive editors for authors for readers submit open access

view article

Figure 9
(a) Spectrum of the fluorescence signal. (b) Normalized fluorescence intensity fluctuation as a function of sampling time using open loop, dual-frequency closed loop with a cut-off frequency of 5 Hz, and closed loops with single pitch adjustments of either DMM or PFM.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 32| Part 1| January 2025|

https://doi.org/10.1107/S1600577524010208

Open

access

Follow J. Synchrotron Rad.

Search IUCr Journals		doi		Advanced search
Author		volume	page