Figure 2
I is the integrated intensity of the elastic scattering, I0 is the incoming photon flux, τ is the transmittance through the sample and the air/helium path, ε is the quantum efficiency of the detector, and p is the polarization factor. Transmittance through the Be or Al windows is included in ε. (a) Bragg analyzer. (b) Laue analyzer. (c) S(Q) of SiO2 glass measured by the Laue analyzer with 27 keV photons (0.17 Å−1 resolution in Q-space). The reflectivity tests were conducted at Q = 2.62 Å−1. |