The Heisenberg-RIXS instrument at the European XFEL

Schlappa, J.; Ghiringhelli, G.; Van Kuiken, B.E.; Teichmann, M.; Miedema, P.S.; Delitz, J.T.; Gerasimova, N.; Molodtsov, S.; Adriano, L.; Baranasic, B.; Broers, C.; Carley, R.; Gessler, P.; Ghodrati, N.; Hickin, D.; Hoang, L.P.; Izquierdo, M.; Mercadier, L.; Mercurio, G.; Parchenko, S.; Stupar, M.; Yin, Z.; Martinelli, L.; Merzoni, G.; Peng, Y.Y.; Reuss, T.; Sreekantan Nair Lalithambika, S.; Techert, S.; Laarmann, T.; Huotari, S.; Schroeter, C.; Langer, B.; Giessel, T.; Buchheim, J.; Gwalt, G.; Sokolov, A.; Siewert, F.; Buechner, R.; Vaz da Cruz, V.; Eckert, S.; Liu, C.-Y.; Sohrt, C.; Weniger, C.; Pietzsch, A.; Neppl, S.; Senf, F.; Scherz, A.; Föhlisch, A.

doi:10.1107/S1600577524010890

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Figure 1
(a) The limits set by the Heisenberg uncertainty for time and energy during a soft X-ray spectroscopy experiment. Lower limits for energy and time resolution at given energy resolving power. We notice that a resolution of 30 meV (the present resolution limit for RIXS at synchrotrons at 1000 eV photon energy) sets the time resolution limit to about 138 fs, which is within the scope of SCS (Gerasimova et al., 2022

) and other European XFEL instruments. (b) The influence of instrumental energy resolution on the appearance of a hypothetical RIXS spectrum of a correlated copper oxide material (Ament et al., 2011

JOURNAL OF
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RADIATION

ISSN: 1600-5775

Volume 32| Part 1| January 2025|

https://doi.org/10.1107/S1600577524010890

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