The Heisenberg-RIXS instrument at the European XFEL

Schlappa, J.; Ghiringhelli, G.; Van Kuiken, B.E.; Teichmann, M.; Miedema, P.S.; Delitz, J.T.; Gerasimova, N.; Molodtsov, S.; Adriano, L.; Baranasic, B.; Broers, C.; Carley, R.; Gessler, P.; Ghodrati, N.; Hickin, D.; Hoang, L.P.; Izquierdo, M.; Mercadier, L.; Mercurio, G.; Parchenko, S.; Stupar, M.; Yin, Z.; Martinelli, L.; Merzoni, G.; Peng, Y.Y.; Reuss, T.; Sreekantan Nair Lalithambika, S.; Techert, S.; Laarmann, T.; Huotari, S.; Schroeter, C.; Langer, B.; Giessel, T.; Buchheim, J.; Gwalt, G.; Sokolov, A.; Siewert, F.; Buechner, R.; Vaz da Cruz, V.; Eckert, S.; Liu, C.-Y.; Sohrt, C.; Weniger, C.; Pietzsch, A.; Neppl, S.; Senf, F.; Scherz, A.; Föhlisch, A.

doi:10.1107/S1600577524010890

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Figure 10
Inner mechanics of the XRD chamber: model revealing degrees of motion for the sample (a), photograph showing the diffractometer and the sample stage (b), and model with overview of the inner mechanics (c).

JOURNAL OF
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Volume 32| Part 1| January 2025|

https://doi.org/10.1107/S1600577524010890

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