The Heisenberg-RIXS instrument at the European XFEL

Schlappa, J.; Ghiringhelli, G.; Van Kuiken, B.E.; Teichmann, M.; Miedema, P.S.; Delitz, J.T.; Gerasimova, N.; Molodtsov, S.; Adriano, L.; Baranasic, B.; Broers, C.; Carley, R.; Gessler, P.; Ghodrati, N.; Hickin, D.; Hoang, L.P.; Izquierdo, M.; Mercadier, L.; Mercurio, G.; Parchenko, S.; Stupar, M.; Yin, Z.; Martinelli, L.; Merzoni, G.; Peng, Y.Y.; Reuss, T.; Sreekantan Nair Lalithambika, S.; Techert, S.; Laarmann, T.; Huotari, S.; Schroeter, C.; Langer, B.; Giessel, T.; Buchheim, J.; Gwalt, G.; Sokolov, A.; Siewert, F.; Buechner, R.; Vaz da Cruz, V.; Eckert, S.; Liu, C.-Y.; Sohrt, C.; Weniger, C.; Pietzsch, A.; Neppl, S.; Senf, F.; Scherz, A.; Föhlisch, A.

doi:10.1107/S1600577524010890

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Figure 6
hRIXS spectrometer overview: diffraction scheme and degrees of motion for operation (a), model of the spectrometer (b), top view of the spectrometer when placed at the interaction point at the two extreme scattering angles: back-scattering at 2Θ = 145° (left) and forward-scattering at tΘ = 65° (right) (c).

JOURNAL OF
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RADIATION

ISSN: 1600-5775

Volume 32| Part 1| January 2025|

https://doi.org/10.1107/S1600577524010890

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