Development of MHz X-ray phase contrast imaging at the European XFEL

Koliyadu, J.C.P.; Moško, D.; Asimakopoulou, E.M.; Bellucci, V.; Birnšteinová, Š.; Bean, R.; Letrun, R.; Kim, C.; Kirkwood, H.; Giovanetti, G.; Jardon, N.; Szuba, J.; Guest, T.; Koch, A.; Grünert, J.; Szeles, P.; Villanueva-Perez, P.; Reuter, F.; Ohl, C.-D.; Noack, M.A.; Garcia-Moreno, F.; Kuglerová-Valdová, Z.; Juha, L.; Nikl, M.; Yashiro, W.; Soyama, H.; Eakins, D.; Korsunsky, A.M.; Uličný, J.; Meents, A.; Chapman, H.N.; Mancuso, A.P.; Sato, T.; Vagovič, P.

doi:10.1107/S160057752400986X

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Figure 2
X-ray beam imaged using the MHz X-ray microscope with (a) the micron KB beam downstream of the focus and parallel beam illumination (b). The field of view in both cases is 1.28 × 0.8 mm. The Fresnel fringes on the top left in (b) arise from the power slit upstream of the IRU chamber and the round features in both images can be attributed to imperfections in the exit window. The measurement was carried out at a photon energy of 9.3 keV for both beam trajectories.

JOURNAL OF
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ISSN: 1600-5775

Volume 32| Part 1| January 2025|

https://doi.org/10.1107/S160057752400986X

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