Development of MHz X-ray phase contrast imaging at the European XFEL

Koliyadu, J.C.P.; Moško, D.; Asimakopoulou, E.M.; Bellucci, V.; Birnšteinová, Š.; Bean, R.; Letrun, R.; Kim, C.; Kirkwood, H.; Giovanetti, G.; Jardon, N.; Szuba, J.; Guest, T.; Koch, A.; Grünert, J.; Szeles, P.; Villanueva-Perez, P.; Reuter, F.; Ohl, C.-D.; Noack, M.A.; Garcia-Moreno, F.; Kuglerová-Valdová, Z.; Juha, L.; Nikl, M.; Yashiro, W.; Soyama, H.; Eakins, D.; Korsunsky, A.M.; Uličný, J.; Meents, A.; Chapman, H.N.; Mancuso, A.P.; Sato, T.; Vagovič, P.

doi:10.1107/S160057752400986X

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Figure 4
Scintillator fluorescent emission decay curves, measured using the slow camera and a gated image intensifier, show the response of the scintillator to the EuXFEL X-ray pulse.

JOURNAL OF
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ISSN: 1600-5775

Volume 32| Part 1| January 2025|

https://doi.org/10.1107/S160057752400986X

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