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Figure 4
Single-shot spectra of a SASE beam. The spectra measurements are performed at E = 7.0 keV with the Si (220) reflection (a) and at E = 10 keV with the Si (333) reflection (b). Furthermore, to characterize the spectral properties of the SASE beam, the 2D spectral images [(a) and (b)] are integrated with the 1D spectra profiles [(c) and (d)]. The regions, indicated by the red dashed boxes, are enlarged and displayed in the corresponding inset figures to demonstrate the achieved spectral resolution of the single-shot spectrometer in the hard X-ray beamline of PAL-XFEL.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 32| Part 1| January 2025| Pages 246-253
https://doi.org/10.1107/S1600577524009779
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