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Figure 5
SASE spectra of ten consecutive XFEL pulses captured from (a) Si (220) at E = 7.0 keV and (b) Si (333) at E = 10.0 keV, showing fluctuations both in peak intensity and spectral distribution.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 32| Part 1| January 2025|
https://doi.org/10.1107/S1600577524009779
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