Figure 6
Typical spectral distribution in a (a, b) SASE beam at Ec = 10004.97 eV, (c, d) monochromatic beam of SASE pulses at Ec = 10000.06 eV and (e, f) seeded beam at Ec = 9996.16 eV. The Si (333) spectrometer is utilized to measure the spectral distribution, and the monochromatic beam is prepared by passing the SASE pulses through a Si (111) DCM. The first column of the figure [(a), (c) and (e)] reveals shot-to-shot spectral fluctuations in the XFEL pulses; the second column [(b), (d) and (f)] shows the average profile of 1000 consecutive shots. However, a single-shot spectrum [inset of (f)] is also investigated, especially for the seeded beam, to obtain a more precise bandwidth of the seeded beam. |