High-resolution imaging of organic and inorganic nanoparticles at nanometre-scale resolution by X-ray ensemble diffraction microscopy

Chen, N.-J.; Yeh, C.-H.; Cao, H.-Y.; Chen, N.-C.; Chen, C.-J.; Chen, C.-Y.; Tsai, Y.-W.; Lin, J.-M.; Huang, Y.-S.; Hsiao, C.-N.; Chen, C.-C.

doi:10.1107/S1600577524010567

Journal of Synchrotron Radiation Journal of
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Figure 1
A schematic layout of the structural determination of organic and inorganic nanomaterials by XEDM experiment using third-generation synchrotron radiation. The incident beam performed snake-step scans across the specimens deposited on a silicon nitride membrane or in a silicon nitride envelope containing the solution. Multiple diffraction patterns were summed to generate a high-resolution diffraction pattern.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 32| Part 1| January 2025|

https://doi.org/10.1107/S1600577524010567

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