High-resolution imaging of organic and inorganic nanoparticles at nanometre-scale resolution by X-ray ensemble diffraction microscopy

Chen, N.-J.; Yeh, C.-H.; Cao, H.-Y.; Chen, N.-C.; Chen, C.-J.; Chen, C.-Y.; Tsai, Y.-W.; Lin, J.-M.; Huang, Y.-S.; Hsiao, C.-N.; Chen, C.-C.

doi:10.1107/S1600577524010567

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Figure 2
Summed patterns (on a logarithmic scale) for silica–gold NPs when different numbers of experimental diffraction patterns were applied, (a) 1, (b) 10, (c) 100, (d) 500, (e) 1000 and (f) 1676. Although the diffraction intensity is extremely weak in each pattern, the circular fringes can be easily recognized when summing a large number of diffraction patterns.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 32| Part 1| January 2025|

https://doi.org/10.1107/S1600577524010567

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