High-resolution imaging of organic and inorganic nanoparticles at nanometre-scale resolution by X-ray ensemble diffraction microscopy

Chen, N.-J.; Yeh, C.-H.; Cao, H.-Y.; Chen, N.-C.; Chen, C.-J.; Chen, C.-Y.; Tsai, Y.-W.; Lin, J.-M.; Huang, Y.-S.; Hsiao, C.-N.; Chen, C.-C.

doi:10.1107/S1600577524010567

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Figure 6
Three diffraction patterns from the NV-LP solution with different χ² values, (a) 507.04, (b) 806.34 and (c) 2039.76. Since streaks should not appear in the diffraction patterns, we removed those diffraction patterns with a χ² value larger than 800. The color bar is on a logarithmic scale.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 32| Part 1| January 2025|

https://doi.org/10.1107/S1600577524010567

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