High-resolution imaging of organic and inorganic nanoparticles at nanometre-scale resolution by X-ray ensemble diffraction microscopy

Chen, N.-J.; Yeh, C.-H.; Cao, H.-Y.; Chen, N.-C.; Chen, C.-J.; Chen, C.-Y.; Tsai, Y.-W.; Lin, J.-M.; Huang, Y.-S.; Hsiao, C.-N.; Chen, C.-C.

doi:10.1107/S1600577524010567

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Figure 7
Summed patterns (on a logarithmic scale) when different numbers of experimental diffraction patterns were applied for the NV-LP solution, (a) 1, (b) 10, (c) 100, (d) 1000 and (e) 10000. Panel (f) shows that the scattering signal from the specimens was expected to be stronger than the background scattering after summing 77170 diffraction patterns.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 32| Part 1| January 2025| Pages 217-224

https://doi.org/10.1107/S1600577524010567

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