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Figure 1
Photograph and layout of the NXE instrument for small-angle X-ray diffraction experiments installed on the Nano Crystallography and Coherent Imaging hutch of the hard X-ray beamline at PAL-XFEL. Key components are labeled: gate valve (GV), quadrant beam position monitor (QBPM), pop-in monitor (PM) and a photodiode (PD).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 32| Part 2| March 2025| Pages 466-473
https://doi.org/10.1107/S1600577525000426
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