New online beam intensity synchronous monitoring system in scanning transmission X-ray microscopy

Jiao, Y.; Zhang, X.; Xu, Z.; Yao, Z.; Sun, T.; Zhang, Y.; Zhao, B.; Guo, Z.; Wang, Y.; Zhen, X.; Liu, H.; Liang, S.; Li, H.; Zhao, X.; He, J.; Tai, R.

doi:10.1107/S1600577524012141

Journal of Synchrotron Radiation Journal of
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Figure 12
The STXM data from Fig. 11

are postprocessed using the reference beam intensity data recorded by the URIDM. Sharp-drop points or noise points owing to the electron beam injections are removed from the STXM data.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 32| Part 2| March 2025|

https://doi.org/10.1107/S1600577524012141

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