New online beam intensity synchronous monitoring system in scanning transmission X-ray microscopy

Jiao, Y.; Zhang, X.; Xu, Z.; Yao, Z.; Sun, T.; Zhang, Y.; Zhao, B.; Guo, Z.; Wang, Y.; Zhen, X.; Liu, H.; Liang, S.; Li, H.; Zhao, X.; He, J.; Tai, R.

doi:10.1107/S1600577524012141

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Figure 13
(a) STXM image without denoise processing, featuring two groups of noise spots resulting from two rounds of electron beam injections. (b) Through identifying and positioning the electron beam injection events using the data captured by the URIDM of the BIMS, the noise spots in the STXM image are removed by the developed image postprocessing algorithm. This process eliminates the impacts of fluctuating beam intensity and electron beam injection on the STXM imaging quality. (c) The left image is obtained by subtracting image (b) from (a) to illustrate the effect of electron beam injection events. The right image is a zoom of a part of the left image with electron beam injection events.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 32| Part 2| March 2025|

https://doi.org/10.1107/S1600577524012141

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