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Figure 7
Top: 2D diffraction pattern of LaB6 collected using 55.32 keV X-rays with the Varex detector placed 923 mm away from the sample. Bottom: a Rietveld refinement of the integrated LaB6 data. Black circles are the data points, the red line is the fit, and the difference is shown beneath. The Rwp for the fit is 1.91.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 32| Part 3| May 2025|
https://doi.org/10.1107/S1600577525001262
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