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Figure 7
Examples of XAFS spectra affected by artefacts and acquired at the beamline (left) and new XAFS spectra (right) obtained post-beam-time using the tools available in Fastosh to exploit the raw fluorescence data saved in the HDF file.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 32| Part 4| July 2025|
https://doi.org/10.1107/S1600577525003923
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