Hyper-resolution in X-ray emission spectroscopy: integrating extended-range high energy resolution fluorescence detection and multiple-crystal spectrometry with advanced binary data splicing

Rijal, R.; Stephens, J.; Sier, D.; Tran, N.T.T.; Nguyen, T.V.B.; Dean, J.W.; Bowman, P.; Dao, M.; Di Pasquale, P.; Kirk, T.; Tran, C.Q.; Hayama, S.; Aramini, M.; Ramanan, N.; Diaz-Moreno, S.; Chantler, C.T.

doi:10.1107/S1600577525004084

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

IUCr IT WDC

home archive editors for authors for readers submit open access

view article

Figure 10
The 14-crystal spectrometer on I20-Scanning for Experiment 4. It includes two separate rows that can be installed with either the same type of crystal to measure a single emission line or different types of crystals to measure distinct edges.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 32| Part 4| July 2025| Pages 994-1009

https://doi.org/10.1107/S1600577525004084

Open

access

Follow J. Synchrotron Rad.

Search IUCr Journals		doi		Advanced search
Author		volume	page