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Figure 7
Flux simulation using the XOP and SHADOW modules in the OASYS software package. (a) Simulated X-ray flux of APS and APS-U undulators with white beam slits matching the acceptance of the KB mirrors. For APS-U, we scaled the spectrum measured without undulator tapering to the simulation and then applied the same scale factor to the spectrum measured with 0.5 keV tapering. (b) Expected flux after the high-heat-load mirrors, considering the silicon stripes. (c) Expected flux at the sample focal spot, accounting for the reflectivity of the ML 48 monochromator and Rh-coated KB mirrors. (d) Expected flux at the detector. Note that the simulation does not account for any additional losses or experimental inefficiencies.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 32| Part 4| July 2025| Pages 1068-1084
https://doi.org/10.1107/S1600577525004953
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