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Figure 3
Images of the monochromated X-ray beam from a bending magnet source taken in (a, inset) inline focusing configuration S–F–I of Fig. 2[link](b′), and (b) in spectrograph configuration S–F–C1–C2–I of Figs. 2[link](a) and 2(b) with the double-crystal element D (C1–C2) dispersing X-rays in the diffraction plane (y-direction). Also shown are beam profiles S(y) and S(x), which are a result of integrating the images over x and y, respectively.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 32| Part 4| July 2025|
https://doi.org/10.1107/S1600577525004278
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