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Figure 10
Comparison between the volume-integrated Bragg reflection intensity 〈I111(t)〉vol,real (blue line) and the Bragg reflection intensity calculated for an effective dose averaged over 50 XTANT realizations (red line). The volume integration was performed for a silicon sample with 64 atoms in the simulation box, using the XTANT results for the doses marked in blue in Fig. 8[link], and assuming a pulse duration of 6 fs FWHM and photon energy of 50 eV. The same parameters were used for the effective dose simulation, except for the dose itself, set to Deff = 4.51 eV atom−1.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 32| Part 5| September 2025| Pages 1106-1115
https://doi.org/10.1107/S1600577525006939
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