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Figure 5
Volume-integrated 111 Bragg reflection intensity [{\langle}I_{111}\rangle_{\rm{vol,\,real}}]. The integration was performed using the XTANT results for the doses marked in blue in Fig. 1[link]. The calculation was performed for a silicon sample with 64 atoms in the simulation box, assuming a pulse duration of 6 fs FWHM and photon energy of 50 eV. The decay in the intensity observed after time zero reflects the progressing displacement of atoms.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 32| Part 5| September 2025| Pages 1106-1115
https://doi.org/10.1107/S1600577525006939
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